Abstract
Synchrotron radiation X-ray fluorescence spectroscopy is a method which allows low elemental concentrations to be measured within a sample. To maintain biological or medical relevance increased importance is being placed on quantifying these in situ localized elemental concentrations. For third generation synchrotron light sources, which have the potential for high sample throughput, a rapid method of obtaining a quantification estimate is needed. Non-destructive transmission and surface analysis techniques for first transition metals, or elements of higher atomic number, using reference standards are examined for different sample property regimes to elucidate methods of quantitative synchrotron radiation X-ray fluorescence spectroscopy.
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