Abstract
We have characterized lateral imperfections of photovoltaic modules based on solution processed polymer-fullerene semiconductor blends by means of lock-in thermography (LIT). The active layer of the solar cell modules is based on the heterogeneous organic semiconductor system poly(3-hexylthiophene):phenyl-C61-butyric acid methyl ester and the power conversion efficiency of the modules reached nearly 2% under irradiation of an AM 1.5 solar simulator. Applying highly sensitive LIT allowed us to detect several kinds of laterally distributed defects originating from imperfections in the respective functional layers as well as in the quality of encapsulation. We show that LIT is a powerful method for the quality control of large area polymer solar cells and modules, enabling fast feedback for optimization of production parameters.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
