Abstract

Chip resistors are a type of resistor among passive components; they are mainly used to regulate the voltage and current in electronic products. A single electronic product may be embedded with dozens of or even more than a thousand thin-film chip resistors varying in resistance. Thin-film chip resistors have low temperature coefficients, which makes them stable and reliable. They have five primary nominal-the-best (NTB) quality characteristics: length, width, height, upper width, and lower width. To increase the quality of thin-film chip resistors and prevent losses from customers returning low-quality or defected products, this study proposes a quality capability assessment method. The proposed method takes sampling errors into account and includes acceptance criteria for individual quality characteristics and the total quality capability. If either of the criteria is not fulfilled, then the manufacturer must improve quality capabilities. A case study of a manufacturer in central Taiwan is presented to illustrate the feasibility of the proposed method. Finally, conclusions and recommendations for future work are presented.

Highlights

  • Taiwan’s electronic industry has unrivaled manufacturing capabilities

  • Process capability indices (PCIs) are powerful tools that are currently widely used in manufacturing industries to assess and analyze process quality

  • Chan et al [16] took into account the degree of shift between the target value T and process mean μ and proposed Cpm, a PCI for NTB quality characteristics

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Summary

INTRODUCTION

Taiwan’s electronic industry has unrivaled manufacturing capabilities. There are over 55 passive component manufacturers in Taiwan, among which Yageo is the top chip resistor manufacturer in the world. Process capability indices (PCIs) are powerful tools that are currently widely used in manufacturing industries to assess and analyze process quality They employ a function of the process mean μ, standard deviation σ , and specification limits to measure product quality and performance. Chan et al [16] took into account the degree of shift between the target value T and process mean μ and proposed Cpm, a PCI for NTB quality characteristics These indices were defined as follows: USL − LSL. A quality capability analysis chart (QCAC) is an effective and convenient way of assisting thin-film chip resistor manufacturers in swiftly checking the process capabilities for each quality characteristic pertaining to their products. We derived the lower confidence limit (LCL) of index Cpm to analyze and evaluate quality capabilities regarding the various quality characteristics of thin-film chip resistors. Conclusions and future work are presented in the Section 5

LOWER CONFIDENCE LIMIT FOR CPM
CASE STUDY
Findings
CONCLUSION
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