Quality Assessment of Transient Response Analysis Method for Detecting Radiation-Induced Faults

José Peralta,Carlos Marqués,Gustavo Demarco,Eduardo Romero,Gabriela Peretti

doi:10.1155/2011/396297

Abstract

We evaluate the ability of transient response analysis method (TRAM), a simple test strategy proposed for filters, to detect deviations in circuit specifications beyond established limits. Particularly, we focus our attention on deviations produced by displacement damage in integrated resistors. This damage is produced by the impact of high-energy particles like the encountered in space environments. For this purpose, we formulate a simple deviation-fault model that takes into consideration the degradation addressed. Additionally, more transient response parameters are taken into account in order to improve the fault coverage. We adopt for our evaluations two typical second-order filters as cases of study. For these filters, the simulation results show that TRAM reaches excellent fault coverage for both filters, suggesting that its use in space applications is encouraging.

Highlights

In space applications, the systems operate in a harsh environment without easy access for maintenance
We evaluate the ability of transient response analysis method (TRAM), a simple test strategy proposed for filters, to detect deviations in circuit specifications beyond established limits
The test parameters (TPs) used as test criterion are listed in the first column with the corresponding fault coverage (FC) percentage value in each row

Summary

Introduction

The systems operate in a harsh environment without easy access for maintenance. The conceptual simplicity of TRAM and the relatively simple measurements required make this test scheme appealing for a wide range of applications In this method, the filter is partitioned into second-order sections. In order to explore the performance of TRAM in space applications it is necessary to employ different fault models This fault model should represent a specific damage but keep reasonable the computational cost of fault simulations. The values of the test attributes can be obtained by evaluating the expressions (1), where ωn is the natural undamped frequency and ζ is the damping factor They characterize the dynamics of a second order filter [16] and are referred in this work as test parameters (TPs)

Transient Response Analysis Method

Filters under Test

Evaluation of Tram Quality

Conclusions