Abstract
The processing and quantification of electron diffraction patterns have become vital in advanced electron crystallographic analysis work. A computer program,QPCED2.0, has been developed for the handling of selected-area electron diffraction patterns for polycrystalline materials.QPCED2.0can be used to enhance the visibility of electron diffraction patterns, to convert electron diffraction patterns into intensity profiles, and to retrieve precisely the latticedspacings and the integral intensities of the diffraction rings. The design and implementation ofQPCED2.0are elucidated and application examples are given.
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