Abstract
The operating speed of Josephson logic gates is restricted by the punchthrough phenomenon, which has a probabilistic nature. The punchthrough probability for identical operating speeds varies according to the type of gate. This paper reports a study of the punchthrough probability for two-junction interferometers and resistor-coupled gates. With the interferometers, the punchthrough probability is predicted from the equation of motion for the center of the phase of the two junctions. With the resistor-coupled gates, the punchthrough probability is calculated by taking into account the dumping effect produced by the resistors of the gates. The predictions are confirmed by computer simulation.
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