Pulsed voltage studies of electric field effects on the optical permittivity of a nematic liquid crystal

Abstract

Abstract Prism coupling to resonant optical modes in a thin layer of homeotropically aligned nematic liquid crystal has been used to characterize the change in refractive indices which occurs when an electric field is applied. Reflectivity data, recorded over a range of angles of incidence for both TE and TM radiation show sharp minima corresponding to the excitation of optical modes in the liquid crystal layer. Application of a pulsed AC voltage, pulsed to avoid heating, while synchronously monitoring reflectivity changes allows detailed characterization of the shift in the position of these minima due to the influence of the electric field on both the ordinary and extraordinary refractive indices. By fitting theoretical predictions of Fresnel theory a complete characterization of change in both these parameters up to an applied field of some 5 × 106 Vm−1 is achieved. The refractive index changes recorded are compared with the director fluctuation order parameter theory with which good agreement is found.