Abstract
Abstract Lead films of thickness 100 A, 250 A. and 350 A were vacuum deposited on AI and laser treated in air using single pulses (7 ns FWHM) from a Nd: glass laser operating in TEM00 mode, at peak energy densities of 1.5-5.0 J/cm2. Rutherford back-scattering of 1.8 MeV He+ ions was employed to determine the depth profiles of Pb in Al. Up to about 1.4 J/cm2, we observe only evaporation loss of Pb and formation of Pb-rich cells on the surface. At higher energies, liquid phase diffusion of Pb is observed up to 4 J/cm2, beyond which convection effects are seen. A quantitative analysis of data for 350 A film at 3.0 J/cm2 shows evidence of nonequilibrium segregation effects.
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