Abstract
The mass spectrometry of pulsed-laser-deposited SiC films led us to the serendipitous discovery of C60 formation from sintered SiC solid due to pulsed KrF excimer laser ablation. Micro-Raman spectroscopy indicates a phase separation or compositional segregation into carbon-rich and Si-rich domains in the laser-deposited SiC films. From other metal carbides such as TiC and WC, C60 could also be produced in the same way. Thus, the pulsed excimer laser ablation is found to provide not only a new route to C60 but also a unique applicability for laser segregation or distillation of solid solutions.
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