Abstract
A system which incorporates pulsed-laser evaporation of targets within the vacuum environment of a combined ion-induced X-ray emission and Rutherford backscattering spectrometer is described. The results of the application of the method to the analysis of a refractory material and to the production of an oxygen free lanthanide film are presented.
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Schedule a callMore From: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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