Abstract
Ferroelectric (Na0.52K0.44Li0.04)(Nb0.84Ta0.10Sb0.06)O3 thin films were epitaxially grown on a (100)SrRuO3∥(100)SrTiO3 substrate by pulsed laser deposition. Crystallographic analysis of the film was performed using conventional X-ray diffraction analysis and rocking curve measurements. High resolution X-ray diffraction reciprocal space map was also measured to analyze the crystallographic relationship between the grown film and the SrTiO3 substrate and to determine the strain state of the film. The full width at half maximum of the rocking curve was as small as 0.19° and the determined pseudo-tetragonal lattice parameters were a=3.947 Å and c=3.955 Å. The P–E hysteresis loop of the film was characteristic of ferroelectric behavior.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
