Abstract
Abstract The damage produced by pulsed electron beam irradiation of vanadium single crystals has been studied by the channeling technique and by thin film X-ray analysis. A surface disorder peak and a small dechanneling component was produced by applying electron energy densities below the melting threshold. The structure of the surface disorder was microcrystalline or amorphous and the dechanneling component could be described by small angle boundaries. After melting of the crystal surface to a depth of approximately 2 μm, epitaxial regrowth with a high defect density took place.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
