Abstract
A pulse-sampling voltmeter designed for measuring low-frequency transistor current gain under large signal conditions is described. The method consists of sampling a waveform at approximately 100 c/s with a 20 μs pulse, which gates the voltage under test at any required point of the cycle. The segment selected by the pulse is amplified and rectified, its amplitude being determined by a comparison technique in which a variable d.c. voltage is fed to the test set in place of the waveform. The equipment presents an input resistance of at least 200 kΩ on all ranges and measures voltages from 100 mv to 75 v with an accuracy to 1%; the upper limit could be extended.
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