Abstract
A new pulsed nonlinearity measurement is described and applied to the characterization of thin-film conductor stripes. The method is based on the phenomenon of ’’baseline shift’’, and is substantially simpler than the already familiar third-harmonic method yet, at least potentially, just as sensitive. A model is proposed in which the observed nonlinearity is attributed to the temperature rise accompanying current in conductors and the associated resistance change. Good quantitative agreement has been obtained with predictions based on the model. A specific application of this method to reliability testing has been found in magnetic bubble memories, the lifetime of which correlated closely with pulse nonlinearity measurements.
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