Abstract
The pulse amplitude fluctuation statistics of the picosecond pulses generated by active mode locking of an external-cavity semiconductor laser are measured experimentally. A comparison is made with predictions from a stochastic mode-locking model, which includes the effects of the spontaneous emission noise and carrier shot noise. Reasonable agreement is obtained for the dependence of the average peak pulse power and the standard deviation of pulse amplitude fluctuations on the bias current.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
