Abstract
Miniaturized electrodes, structures, and devices are necessary to achieve high target selectivity during stimulation in single neuron networks, while significant charge transfer is essential. A reliable test method is required to evaluate charge injection capability for neural stimulation applications that demand both a large amount of charge injection and a small electrode size. A custom made pulse-clamp circuit was employed to characterize sputtered iridium oxide film (SIROF) microelectrodes. Pulse-clamp measurements with 400 μs long pulses are performed in 154 mM phosphate buffered saline (PBS) solution on planar microelectrodes smaller than 100 μm in diameter. A cell model was used to verify the circuit design with SPICE simulations. The pulse-clamp results of SIROF electrodes of different sizes show charge losses of less than 6%, even at high charge density levels.
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