Publisher’s Note: “Effect of electron temperature fluctuations on slowly swept Langmuir probe measurements” [Rev. Sci. Instrum. 75, 4334 (2004)

D L Rudakov,J A Boedo,A Mclean,P C Stangeby,J G Watkins,R A Moyer

doi:10.1063/1.1849512

Publisher’s Note: “Effect of electron temperature fluctuations on slowly swept Langmuir probe measurements” [Rev. Sci. Instrum. 75, 4334 (2004)

D L Rudakov, J A Boedo + Show 4 more

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https://doi.org/10.1063/1.1849512

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Journal: Review of Scientific Instruments

Publication Date: Dec 23, 2004

Affiliation: University of California, San Diego, University of Toronto, Sandia National Laboratories

#Effect Of Temperature Fluctuations #Effect Of Fluctuations + Show 7 more

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Publisher’s Note: “Effect of electron temperature fluctuations on slowly swept Langmuir probe measurements” [Rev. Sci. Instrum. 75, 4334 (2004)

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