Abstract
We present the ptychographical reconstruction of the x-ray beam formed by nanofocusing lenses (NFLs) containing a number of phase singularities (vortices) in the vicinity of the focal plane. As a test object Siemens star pattern was used with the finest features of 50 nm for ptychographical measurements. The extended ptychographical iterative engine (ePIE) algorithm was applied to retrieve both complex illumination and object functions from the set of diffraction patterns. The reconstruction revealed the focus size of 91.4±1.1 nm in horizontal and 70±0.3 nm in vertical direction at full width at half maximum (FWHM). The complex probe function was propagated along the optical axis of the beam revealing the evolution of the phase singularities.
Highlights
Phase singularities are a common feature of different forms of waves and represent a fundamental topology property of wave fields [1]
In this work we apply ptychography technique to reconstruct the wave field generated by nanofocusing lenses (NFLs) in the hard x-ray regime
Two perpendicularly positioned NFLs based on parabolic compound refractive x-ray lenses (CRLs) were used to obtain a nano-sized focus of the incident x-ray beam with 15.25 keV energy
Summary
Phase singularities are a common feature of different forms of waves and represent a fundamental topology property of wave fields [1]. Vortices can be characterized by the integer number S (positive or negative) that is called a strength or topological charge of the singularity and is determined by S=(1/2π) dφ, where C is any closed path around the vortex point. In this work we apply ptychography technique to reconstruct the wave field generated by nanofocusing lenses (NFLs) in the hard x-ray regime.
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