PSIC-Net: Pixel-Wise Segmentation and Image-Wise Classification Network for Surface Defects

Abstract

Recent years have witnessed the widespread research of the surface defect detection technology based on machine vision, which has spawned various effective detection methods. In particular, the rise of deep learning has allowed the surface defect detection technology to develop further. However, these methods based on deep learning still have some drawbacks. For example, the size of the sample data is not large enough to support deep learning; the location and recognition of surface defects are not accurate enough; the real-time performance of segmentation and classification is not satisfactory. In the context, this paper proposes an end-to-end convolutional neural network model: the pixel-wise segmentation and image-wise classification network (PSIC-Net). With the innovative design of a three-stage network structure, improved loss function and a two-step training mode, PSIC-Net can accurately and quickly segment and classify surface defects with a small dataset of training data. This model was evaluated with three public datasets, and compared with the most advanced defect detection methods. All the performance metrics prove the effectiveness and advancement of PSIC-Net.