Abstract
The third order optical aberrations models for LSI/LSV (Linear Space Invariant/Variant) systems is described in this paper. These models are based on Seidel and Zernike approximating polynomials. Optical aberrations effect to the PSF (Point Sread Function) of optical imaging systems is described as well. Higher quality and precision of image data can be obtained with deconvolution of the acquired images and system point spread function. The PSF can be modelled as a space variant function from the estimation of optical system wavefront aberrations.
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