Abstract
Two types of tracks left by 4He particles at different angles of incidence to CA8015 detectors were successfully discriminated by an SEM coupled to a micro-computer image processing system. To achieve this end, a track signature is defined based on the image's gray level distribution which results from the interaction between the track profile and the electron beam. The principles of track signature extraction, determination of discriminant functions and the design of the ad hoc supervised classifier are described. Finally the possibility of obtaining the track profile through digital analysis of track signatures is discussed.
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