Abstract
Pseudocoheren ce provides a major source of possible systematic error in measurements of the optical constants of heavily absorbing solids by reflection Dispersive Fourier Transform Spectroscopy. It arises when the reflecting surface of a specimen is not perfectly flat. An analytic model of its effects on the measured absorption and refraction spectra in such a measurement is presented. This allows the tolerances required for the flatness of the reflecting surface of the specimen to be derived. These are proportional to wavelength. This demonstrates that while the replacement method of reflection DFTS is only well-suited to FIR studies, the switched field-of-view method can be used in all spectral regions for which FTS is practicable.
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