Abstract
Abstract Further development of the Davis and Slack method (1926) of measuring X-ray refractive indices for any solid substances with the double-diffractometer was achieved. The resulting increase in accuracy for δ = 1 − n is of an order of magnitude of up to 0.1 %. For Si with CuK α 1, the result was δ = (7.657 ± 0.0087) · 10−6 and therebyf′ = 0.41 ± 0.016 for the dispersion correction of the atomic scattering factor.
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