Abstract
A proton microbeam has been used to obtain charge collection efficiency maps on cross sections of natural IIa diamond and CVD diamond samples with a sandwich arrangement of electrodes. Particular attention has been dedicated to the dependence of the collection efficiency profiles on bias polarity. Collection efficiency maps may be easily transformed into collection length profiles, giving information about the distribution of mobility and lifetime of carriers and the profile of the electric field. Maps of the proton-induced luminescence have also been obtained. The results confirm the columnar distribution of the charge collection length in CVD diamond, while in natural diamond the distribution is relatively homogeneous.
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