Abstract
Proton induced X-ray emission (PIXE) technique has been used for identification and quantitative analysis of the elemental concentration in thick bread samples. Bread samples were air-oven dried at 60 oC and milled in a clean agate mortar to homogenize the sample and pressed into a pellet. PIXE technique relies on the analysis of the energy spectra of the characteristic X-ray emitted from the thick bread sample and the orchard leaf standard (NIST- SRM -1571) bombarded with 2.0 MeV protons. The concentration of the elements ( Cl , K , Ca , Mn , Fe , Cu , and Zn ) in the bread samples was determined by comparison with NIST orchard leaf standard. The accuracy of the measurements ranged between ± 2% and ± 10% for the most elements detected in this method. The aim of this study is to establish the reference concentration of trace elements in the Iraqi bread using PIXE technique.
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