Abstract

Electron 3D crystallography can reveal the atomic structure from undersized crystals of various samples owing to the strong scattering power of electrons. Here, a direct electron detector DE64 was tested for small and thin crystals of protein and an organic molecule using a JEOL CRYO ARM 300 electron microscope. The microscope is equipped with a cold-field emission gun operated at an accelerating voltage of 300 kV, quad condenser lenses for parallel illumination, an in-column energy filter, and a stable rotational goniometer stage. Rotational diffraction data were collected in an unsupervised manner from crystals of a heme-binding enzyme catalase and a representative organic semiconductor material Ph-BTBT-C10. The structures were determined by molecular replacement for catalase and by the direct method for Ph-BTBT-C10. The analyses demonstrate that the system works well for electron 3D crystallography of these molecules with less damaging, a smaller point spread, and less noise than using the conventional scintillator-coupled camera.

Highlights

  • Electrons are scattered by light atoms 4–5 orders of magnitude more strongly than X-rays

  • we have already succeeded in solving other new atomic structures including polypeptides

  • Radiation damage is serious in both X-ray analysis

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Summary

Introduction

Electrons are scattered by light atoms 4–5 orders of magnitude more strongly than X-rays This property makes electron crystallography applicable to undersized crystals of various samples, which are hard to grow to a suitable size for X-ray diffraction even with a high-intensity synchrotron radiation beam. Rotational and precession techniques could reduce the effect by multiple interactions of single electron known as dynamical scattering in recored patterns (e.g., Vincent and Midgley, 1994; Oleynikov et al, 2007; Nannenga et al, 2014a, 2018), and this effect is not very severe in thin protein crystals composed of light atoms and with high mosaicity (Yonekura et al, 2015). Inelastic scattering is problematic for thick crystals and/or highly-tilted crystals, due to the shorter mean free path of inelastically scattered electrons compared to elastically scattered ones (Angert et al, 1996) This problem can be eased with use of higher-energy electrons and an energy filter

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