Abstract
ABSTRACTStabilized Zirconia thin films were deposited by R. F. Magnetron Sputtering onto iron substrates. Deposition parameters such as gas pressure and R. F. voltage were optimized to obtain homogeneous and well adherent protective coatings. The morphology and structure of films before and after thermal treatments were investigated by Scanning Electron Microscopy (SEM), X-Ray Diffraction (XRD) and Thermogravimetrical Analysis (TGA).Auger Electron Spectroscopy (AES) depth profiling techniques were used to obtain the chemical distribution of the elements in order to study the influence of two important parameters on the adhesion of the ceramic: the presence of a thin layer of native metal oxide and the residual surface roughness after polishing.The effectiveness of coatings to protect the metal substrate against high temperature oxidation in air was evaluated by thermogravimetrical analysis at 773K. The protective action of the ceramic film was well demonstrated.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
