Abstract
Abstract In this study, protective Ti coatings were deposited on the CoSb 3 substrate by DC magnetron sputtering to prevent the sublimation of Sb. The microstructure of Ti coating was observed by SEM and AFM. The thermal aging behaviors of coated CoSb 3 samples were investigated through accelerated aging at 650 °C for 24 h. The results indicated that Ti coatings were columnar crystals and body-centered cubic structure. The preferred orientation of Ti film was along the crystal plane of (0 0 2). The thickness of Ti film increased with the deposition time increasing. The weight loss decreased with the thickness of Ti coating increasing. Compared with the uncoated CoSb 3 material, the degradation of thermoelectric properties for coated CoSb 3 samples decreased slowly after accelerated thermal aging test.
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