Abstract
eAssessment The application of multiterminal (MT), high-voltage dc (HVdc) (MTdc) grid technology requires test procedures for the operation and implementation of the protection solutions. The test procedures are usually derived from experience and from extensive measurement data, which, at present, are still not widely available. Based on a hardware-inthe- loop (HIL) method, advanced dc protection testing strategies, utilizing existing experience for ac grids and requirements for MTdc grids, may overcome this gap.
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