Prospects for higher spatial resolution quantitative X-ray analysis using transition element L-lines

Abstract

Lowering electron beam kV reduces electron scattering and improves spatial resolution of X-ray analysis. However, a previous round robin analysis of steels at 5 – 6 kV using Lα-lines for the first row transition elements gave poor accuracies. Our experiments on SS63 steel using Lα-lines show similar biases in Cr and Ni that cannot be corrected with changes to self-absorption coefficients or carbon coating. The inaccuracy may be caused by different probabilities for emission and anomalous self-absorption for the La-line between specimen and pure element standard. Analysis using Lℓ(L3-M1)-lines gives more accurate results for SS63 plausibly because the M1-shell is not so vulnerable to the atomic environment as the unfilled M4,5-shell. However, Lℓ-intensities are very weak and WDS analysis may be impractical for some applications. EDS with large area SDD offers orders of magnitude faster analysis and achieves similar results to WDS analysis with Lα-lines but poorer energy resolution precludes the use of Lℓ-lines in most situations. EDS analysis of K-lines at low overvoltage is an alternative strategy for improving spatial resolution that could give higher accuracy. The trade-off between low kV versus low overvoltage is explored in terms of sensitivity for element detection for different elements.