Proposal of Analog In-Memory Computing With Magnified Tunnel Magnetoresistance Ratio and Universal STT-MRAM Cell

Abstract

In-memory computing (IMC) is an effective solution for energy-efficient artificial intelligence applications. Analog IMC amortizes the power consumption of multiple sensing amplifiers with an analog-to-digital converter (ADC) and simultaneously completes the calculation of multi-line data with a high parallelism degree. Based on a universal one-transistor one-magnetic tunnel junction (MTJ) spin transfer torque magnetic RAM (STT-MRAM) cell, this paper demonstrates a novel tunneling magnetoresistance (TMR) ratio magnifying method to realize analog IMC. Previous concerns including low TMR ratio and analog calculation nonlinearity are addressed using device-circuit interaction. The TMR is magnified <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$7500\times $ </tex-math></inline-formula> using a latch structure in combination with the device. Peripheral circuits are minimally modified to enable in-memory matrix-vector multiplication. A current mirror with a feedback structure is implemented to enhance analog computing linearity and calculation accuracy. The proposed design maximumly supports 1024 2-bit input and 1-bit weight multiply-and-accumulate (MAC) computations simultaneously. The proposal is simulated using the 28-nm CMOS process and MTJ compact model. The integral nonlinearity is reduced by 57.6% compared with the conventional structure. 9.47-25.4 TOPS/W is realized with 2-bit input, 1-bit weight, and 4-bit output convolution neural network (CNN).