Abstract
Peaks appear after proportional differentiation of cumulative distribution functions of Weibull and lognormal distributions. The characteristic parameters can be extracted from the proportional difference peaks because these peaks are related to the characteristic parameters directly. On this basis, a simple method known as the proportional difference estimate (PDE) method for determining the characteristic parameters of multimodal failure distributions was developed. This method can be applied to microelectronics dielectric and interconnect reliability studies.
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