Properties of ZnO Micro/Nanostructures on Aluminum Substrates

Abstract

Zinc oxide (ZnO) micro/nanostructures were produced as thin films on aluminum substrates using the spray pyrolysis method at a substrate temperature Ts = 350 ± 5 °C. The films were characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM) that is supported by energy dispersive spectroscopy (EDS), and X-ray fluorescence (XRF). The films displayed hexagonal structure as shown in the XRD diffractograms and SEM observations. XRD diffractograms showed that the strongest reflection is that from the (002) plane, which means the preferred direction of crystal growth, is along the c-axis, perpendicular to the substrates. From the SEM images, it is found that the films have hexagonal micro/nanorods structure. EDS and XRF detected the presence of Zn, O, and other impurities in the films. A future study of the optical and electronic properties is necessary to examine the potential of using such films in optoelectronic industry and other technologies.