Abstract
A method for the determination of parameters of the surface layer (thickness and refraction index) at the liquid-vapor interface in binary liquid mixtures was developed. The parameters of the surface layer for the C7H14-C7F14 liquid mixture in the vicinity of the critical point, which was studied by means of ellipsometry in [1], were calculated using the proposed method. The temperature dependences of the thickness and refraction index that were determined in the homogeneous isotropic layer approximation at the interface liquid-vapor, show structural peculiarities that were not observed earlier. Their appearance is explained by the possible influence of hydrodynamic processes at the boundary.
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