Properties of superconducting weak links prepared by ion implantation and by electron beam lithography

Abstract

In this paper, we present our latest results on the properties of superconducting weak links prepared in Mo films by ion-implantation and in Nb films by electron-beam lithography. In the case of the ion-implanted weak links, which structurally resemble proximity-effect bridges, we find that the static properties are quite well described by a recent theory of Likharev and Yakobson. We further find that the rf response of these weak links is in excellent agreement with quasistatic resistively-shunted-junction model calculations based on a sinusoidal current-phase relation at those temperatures for which such a current-phase relation is predicted by the static theory of Likharev and Yakob-son. For the e-beam fabricated Nb bridges, which have the Dayem bridge geometry, our sample preparation techniques have allowed us to produce bridges and two-junction interferometers in which the link dimensions are as small as about 2000 Angstroms. We find that Josephson effects are observable in these bridges even when the bridge dimensions exceed the temperature-dependent coherence length by about an order of magnitude, but are still less than the effective thin-film penetration depth.