Abstract
Thin films of CdSxTe1-x were deposited by the pulse electrodepsoition technique using cadmium sulphate, sodium thiosulphate and tellurium di oxide on titanium and conducting glass substrates. Structural studies indicated the formation of polycrystalline films possessing hexagonal structure. The resistivity varies from 53 ohm cm to 8 ohm cm as the stochiometric co-efficient 'x' value decreases from 1 to 0. It is observed that a post heat treatment temperature of 550 C results in high photosensitivity as well as low light resistance. The optical constants, refractive index(n) and extinction coefficient(k) were evaluated from the transmission spectra of the films of different composition.
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