Abstract
The properties of a La0.67Sr0.33MnO3 (LSMO)/YBa2Cu3O7-δ (YBCO) interface in thin film LSMO/YBCO cross-strip type junctions were investigated by means of electrical transport measurements. Resistance vs. temperature and current-voltage dependences, as well as conductance spectra, were used to characterize the electrical parameters of the interface. The results indicated a low resistance (below 10 Ω), while the dielectric properties of the interface pointed to the presence of a 10-nm wide and 40-meV high dielectric potential barrier. The oxygen vacancies in both LSMO and YBCO films at the interface and the charge transfer through the interface were both considered to explain the insulating character of the LSMO/YBCO interface.
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