Abstract

Gas effusion spectra, the resistivity, constant photocurrent spectra and photothermal deflection spectroscopy for the fullerene are used to study properties of fullerenes which could be understood as intercalated materials. Several gas effusion peaks of the oxygen are observed in gas effusion spectra. Fullerene films effused out intercalated gases show semiconducting properties with an activation energy of 0.46~0.51eV. Constant photocurrent spectra of fullerenes which can only be measured in photoconductive semiconducting materials are compared with photothermal deflection spectra.

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