Abstract
Ag layered Te/Cd stack thin films (<1 µm thick) were prepared by the Stacked Elemental Layer (SEL) method. The XRD results revealed that the synthesized films had a polycrystalline nature. The synthesized films were preferentially oriented with (111) directions with a cubic phase. Structural studies were evidenced the formation of Ag related alloys at high annealing temperatures as a result of thermal diffusion in elemental stack. Optical and photo-resistivity studies revealed the influence of Ag on the CdTe lattice at high annealing temperatures. Surface morphology and the influence of Ag atoms on surface roughness are also presented.
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