Abstract
The surface properties and anodization characteristics of evaporated aluminum films have been studied by ellipsometry. Correlations have been made between the surface quality and the ellipsometry measurements. The optical properties and growth characteristics of barrier anodic oxide films have been determined and found to be the same as those of anodic oxides formed on bulk aluminum.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
