Abstract
We have measured the propagation losses of Cu—Na-ion-exchanged channel glass waveguides using both scattering and interferometric methods. In the first method, the waveguide was coated with a fluorescence film to enhance the scattered optical field along the channel waveguide which was then captured by a charge-coupled device camera. A straight line is adjusted to the intensity profile by the least-squares method, and the slope yields the attenuation coefficient. In the interferometric method, the temperature of the waveguides was changed and the intensity output was, measured. From contrast changes of waveguide's intensity output, the attenuation coefficient is calculated. Also, an analysis of the optical absorption of copper waveguides in the 200–1900 nm range to detect the copper oxidation state is presented.
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