Abstract
Propagation and deflection of microcracks driven by electric loading in <001>-oriented 0.69Pb(Mg1/3Nb2/3)O3-0.31PbTiO3 ferroelectric single crystals were investigated using an in-situ transmission electron microcopy (TEM) technique. The static observation of the domain pattern revealed the coexistence of sub-micrometer and nano-meter domains. Electric field induced deviation from the main microcrack path and subsequent propagation along the direction almost perpendicular to the electric field were observed directly. A qualitative analyses is given based on the maximum energy release rate criterion.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
