Projection angle dependence in grating-based X-ray dark-field imaging of ordered structures

Abstract

Over the recent years X-ray differential phase-contrast imaging was developed for the hard X-ray regime as produced from laboratory X-ray sources. The technique uses a grating-based Talbot-Lau interferometer and was shown to yield image contrast gain, which makes it very interesting to the fields of medical imaging and non-destructive testing, respectively. In addition to X-ray attenuation contrast, the differential phase-contrast and dark-field images provide different structural information about a specimen. For the dark-field even at length scales much smaller than the spatial resolution of the imaging system. Physical interpretation of the dark-field information as present in radiographic and tomographic (CT) images requires a detailed look onto the geometric orientation between specimen and the setup. During phase-stepping the drop in intensity modulation, due to local scattering effects within the specimen is reproduced in the dark-field signal. This signal shows strong dependencies on micro-porosity and micro-fibers if these are numerous enough in the object. Since a grating-interferometer using a common unidirectional line grating is sensitive to X-ray scattering in one plane only, the dark-field image is influenced by the fiber orientations with respect to the grating bars, which can be exploited to obtain anisotropic structural information. With this contribution, we attempt to extend existing models for 2D projections to 3D data by analyzing dark-field contrast tomography of anisotropically structured materials such as carbon fiber reinforced carbon (CFRC).