Abstract
Projectile $K$-Auger-electron production measurements were performed for the bare, one-, and two-electron ions of C, N, O, and F incident on He, Ne, Ar, and Kr gases. The measurements were taken over an energy range of $\frac{1}{4}$ to $\frac{2}{3}$ MeV/amu using a cylindrical mirror analyzer. For the incident two-electron ions, single-electron capture to excited states of the ${(1s2s)}^{3}S$ metastable component of the incident beam was the principal mechanism giving rise to the observed $K$-Auger transitions. For the bare and one-electron ions, double electron capture to excited states was the dominant mechanism leading to $K$-Auger-electron production. In addition to Auger-spectroscopy measurements, total $K$-Auger production cross sections were determined as well as the partial cross sections for electron capture to specific $n$ levels of the projectile. The $n$ distributions were also measured for double electron capture to excited states of the bare and one-electron ions.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.