Abstract
XRF imaging and analysis at the Siam Photon Laboratory have been recently developed for supporting various applications in x‐ray micro analysis. An experimental setup for white beam x‐ray fluorescent imaging has been installed at the beamline BL2 for elemental and quantitative analyses. A white micro beam of 163×170 μm2 (FWHM) measured by wire scanning has been delivered to samples using a polycapillary x‐ray half‐lens. The fluorescent emissions of characteristic x‐rays (1 keV and above) are detected by a Si‐PIN detector. XRF imaging of Ni grids on supporting glass and XRF analysis on a trace‐element standard were conducted for testing the apparatus. The test results on these samples as well as the necessary software developed for elemental identification and imaging are presented.
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