Production scheduling algorithms for a semiconductor test facility

Abstract

The authors develop production scheduling algorithms for semiconductor test operations. The operations in the facility under study are characterized by a broad product mix, variable lot sizes and yields, long and variable setup times, and limited test equipment capacity. The approach presented starts by dividing the facility or job shop into a number of work centers. The method then proceeds to sequence one work center at a time. A disjunctive graph representation of the entire facility is used to capture interactions between work centers. The introduction of different management objectives leads to different work center problems and different production scheduling algorithms. The authors present algorithms for two different work center problems. Direction for future research are discussed. >