Abstract

State-specific dissociation dynamics for ionic fragments and excited fragments of gaseous SiCl 4 following Si 2p core-level excitation have been characterized by the dispersed UV/optical fluorescence spectroscopy and photionization mass spectroscopy. The Si 2p core-to-Rydberg excitation leads to a noteworthy production of excited atomic fragments, neutral and ionic (Si *, Si +*). In particular, the excited neutral atomic fragments Si * are significantly reinforced. The Si 2p core-to-valence excitation generates an enhancement of excited molecular-ion SiCl 4 +. The experimental results provide deeper insight into the dissociation dynamics for excited neutral fragments of molecules via core-level excitation.

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