Abstract
We have observed the enhancement of Xe30,32+ ion beam intensity from the RIKEN 18 GHz electron cyclotron resonance ion source (ECRIS) using an electrode at bias voltage of ∼ -100 V. We have successfully obtained beam intensities of 11 eµA for the Xe30+ ion beam and 4 eµA for the Xe32+ ion beam using this method at an extraction voltage of 13 kV.
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