Abstract
Within the scope of the study, tellurium iodide (TeIx) crystalline thin film was produced via chemical bath deposition on substrates (commercial glass). Transmittance, absorption, optical band gap and refractive index were examined by Ultra violet/visible spectroscopy. X-ray diffraction revealed that the structure was hexagonal. Structural and optical properties of TeIx thin films, produced at different iodine concentrations were analyzed. Scanning electron microscope was used for surface analysis, whereas electron microscope analysis was used to determine the elemental ratio in the films. It has been found that characteristics of the films, such as structure, porosity, average grain size, number of crystalline per unit area etc., were changed with iodine concentration. Iodine concentration has varied between 2.5×10−3 and 10×10−3M. Optical band gap has been increased with iodine concentration, taking values between 3.72 to 3.90eV. Also, film thickness has been changed from 237nm to 866nm, according to iodine concentration. In addition, the effect of porosity on structural properties of thin films was investigated.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
