Abstract

Product infant failure is the most crucial part of product quality risk that critically affects customer satisfaction. However, most of manufacturers lack sufficient understanding of the formation mechanism of product infant failure and quantitative infant failure risk modeling technology. These issues cause the inefficiency of warranty policy in preventing and controlling infant failure risk. Therefore, first, on the basis of the reverse mapping process of axiomatic design, an infant failure risk formation chain, that is, “process quality variation—physical defect—functional vulnerability—infant failure,” is proposed in this study by considering quality variation propagation and functional failure dependency to determine the inherent formation and dependent enlarging process of the risk. Second, on the basis of the risk formation chain, the infant failure risk is modeled from inherent risk and dependent risk. Specifically, the inherent infant failure risk is computed based on the stream of quality variation in production, whereas the dependent infant failure risk is computed by a Bayesian network by considering the functional failure dependency. Finally, a case study of an illustrative electromechanical system is introduced to verify the applicability of the proposed method. Result shows that the proposed method has a better performance in infant failure risk modeling.

Highlights

  • Quality risk is emphasized for product quality improvement according to the newly released ISO 9001:2015 standard.[1]

  • A novel risk modeling approach for product infant failure by considering quality variation propagation and functional failure dependency is presented in this work

  • The top three critical components of infant failure analyzed using the proposed method are X8, X4, and X7, which account for 59.6% of the total expected cost of the electromechanical system (EMS) failure, whereas the top three critical components of infant failure analyzed using the costbased failure mode and effect analysis (FMEA) method are X4, X3, and X5, which account for 55.3% of the total expected cost of the EMS failure

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Summary

Introduction

Quality risk is emphasized for product quality improvement according to the newly released ISO 9001:2015 standard.[1]. A novel risk modeling approach for product infant failure by considering quality variation propagation and functional failure dependency is presented in this work. On the basis of the analysis of the front part of infant failure risk chain, inherent infant failure probabilities are present in defective components after the product is produced. This phenomenon is due to the KQC variations in manufacturing process, which constitutes bottom events of the DIFT. Quality variation of KQCs exists and propagates in each station and may cause physical defects (i.e. exterior and interior defects) of the component and result in infant failure. Despite the difference in failure mechanisms between the AND gate and HSP, the conditional probability distribution of the output nodes for HSP is identical; they are not repeated

Functional dependency
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